Scanning electron microscope

ABSTRACT

It is facilitated in a scanning electron microscope to save the labor of executing the reproduction test, conduct basic analysis on a problem caused in execution of the automatic observation process, and confirm details resulting in the error. Upon detecting an error from an abnormality, the scanning electron microscope extracts a sample image lm(t 2 ) obtained by retroceding from a sample image lm(te) stored so as to be associated with time te of error occurrence by a predetermined video quantity (for example, total recording time period t 2 ) previously set and registered by an input-output device, from sample images stored in a recording device while being overwritten, and stores a resultant sample image in another recording device.

CROSS REFERENCE TO RELATED APPLICATION

This application is a Continuation of U.S. application Ser. No.11/357,020, filed Feb. 21, 2006 now U.S. Pat. No. 7,446,313, whichclaims priority from Japanese Patent Application No. 2005-047724, filedFeb. 23, 2005, the contents of which are incorporated herein byreference.

BACKGROUND OF THE INVENTION

The present invention relates to a scanning electron microscope whichdetects a signal generated from a sample by scanning irradiation of anelectron beam and forms a scanning image of a sample (sample image). Inparticular, the present invention relates to a scanning electronmicroscope suitable for an automatic observation process such as a CD(Critical Dimension) measurement process of a predetermined portion on asample and an inspection process of a dust particle or a defect on thesample.

As integration of semiconductor elements advances in recent years, thescanning electron microscope (SEM) is applied to measurement andinspection of fine circuit patterns. For example, the scanning electronmicroscope is also applied to CD measurement of a specific pattern of achip formed on a wafer in a semiconductor manufacturing line.

In such a scanning electron microscope applied to the CD measurementprocess in the semiconductor manufacturing line, automation is promotedto prevent a person from generating dust and enhance the processingcapability in the same way as other constituent devices in thesemiconductor manufacturing line.

In order to conduct CD measurement on a target pattern (specificpattern) on a wafer by using a scanning electron microscope, theconventional scanning electron microscope executes the followingobservation process as the CD measurement process.

(1) After a sample (for example, a wafer having a chip formed thereon)is carried in a sample chamber, the stage is moved to an alignmentpoint. Alignment (aligning a coordinate system on the wafer with acoordinate system that the stage in the apparatus has) is conducted onthe sample carried in to conduct global alignment.

(2) The stage is moved to a previously registered measurement point. Themeasurement point is detected at low magnification.

(3) Focusing is executed to adjust the focal length of the object lensso as to obtain a scanning image at the detected measurement point withan optically optimum beam diameter. Thereafter, the magnification is setto a measurement magnification (high magnification).

(4) A place to be subject to length measurement is detected from anobtained sample image on the basis of a previously registered referencetemplate.

(5) The CD measurement is executed on the detected place to be subjectto the length measurement.

In the scanning electron microscope, a series of sequences such as thesample conveyance, the alignment, the pattern detection at themeasurement point, the focusing and the length measurement is previouslyregistered as a program in order to conduct the observation processincluding the sequences (1) to (5) automatically. At the time ofautomatic operation, control means (a computer) reads out this programfile from a recording device, and executes the observation processincluding the series of sequences automatically. In general, a programfile for executing the observation process including the series ofsequences is called recipe.

For example, in the case of the recipe of the CD measurement process inthe above-described semiconductor manufacturing line, basic information(the measurement condition) required for the measurement, such as thealignment point position, measurement point position and measurementmagnification, and image information and signal information (referred toas template) including a characteristic pattern which serves as a guidefor detecting the accurate position and CD at the measurement point areregistered in the recipe.

The detection of the alignment point position and the measurement pointposition is conducted using a technique (the so-called templatematching) of comparing image information or signal information actuallyobtained from the sample on the basis of execution of an acquisitioninstruction contained in the algorithm of a series of processes when theseries of processes based on the recipe is executed, with the templatein the recipe, and finding a place having the strongest resemblance.

In the scanning electron microscope applied to the automatic observationprocess such as the above-described CD measurement process, theautomatic observation process is conducted in accordance with thepreviously registered recipe. In some cases, however, the execution ofthe observation process including the series of sequences fails.

For example, if the measurement point coordinates or alignment pointcoordinates registered in the recipe are unsuitable, then informationcorresponding to image information of the actually obtained sample imageis not present in the template image information (reference template),and consequently it becomes impossible to conduct the pattern detection.

On the contrary, also in the case where the signal information or theimage information of the sample image obtained at the time of executionof the recipe is made different from the template by a change in thesample generation process, it becomes impossible to conduct the patterndetection.

If the signal quantity of the pattern used in auto-focusing is notsufficient, the focusing fails.

Such execution errors in the automatic observation process can beclassified into the following three categories: (1) the case where therecipe generation method is unsuitable; (2) the case where the samplegeneration process changes and the measured pattern shape is notsupposed at the time of recipe registration; and (3) the case where anerror is caused by a defect in the algorithm for the series of processesexecuted on the basis of the recipe.

In any case, a suitable countermeasure must be taken to use the scanningelectron microscope according to the purpose. Therefore, it is necessaryto first analyze the failure cause.

As its analysis technique, it is necessary in the conventional techniqueto prepare a sample in which an error is likely to occur and a recipefor which a failure has occurred in order to reproduce the failure, andconduct an experiment for reproducing the problem by using the sampleand the recipe.

In the experiment for reproducing this problem, causes of the errorwhich has caused the failure are classified into (a) sequence, (b)image, (c) operation of the recipe, and (d) situations of image andhardware, and confirmation is conducted.

As regards the execution of the experiment for reproducing the problem,however, (p) the sample, (q) the apparatus, (r) the recipe, and (s) theoperator are needed. In addition, if the event of the problem does notoccur immediately even if the experiment is executed, it is necessary torepetitively execute the experiment until the event can be reproduced.During that time period, the items (p) to (s) cannot be used for theoriginal purpose.

In another analysis technique heretofore executed, a sample imageobtained when an error has occurred is preserved and the cause of theerror is presumed on the basis of the sample image.

For example, a semiconductor processing apparatus described inJP-A-2003-17378 has a configuration in which a measurement control unitcontrols a measurement unit for measuring a pattern on a semiconductorsubstrate and an image pickup unit including a camera to pick up animage of the pattern on the semiconductor substrate by executing ameasurement process according to a recipe. In addition, in thesemiconductor processing apparatus, the measurement control unitcontrols the image pickup unit on the basis of an acquisitioninstruction contained in an algorithm of the measurement process basedon a recipe. An image of a moving picture is picked up by a camera. Themoving picture is stored in a memory. Thereafter, when the measurementprocess is finished, the moving picture stored in the memory is recordedon a disk for moving picture.

SUMMARY OF THE INVENTION

However, the semiconductor processing apparatus described inJP-A-2003-17378 has a configuration only for picking up an image of thepattern on the semiconductor substrate while the measurement unit ismeasuring the pattern on the semiconductor substrate after themeasurement stage has moved the semiconductor substrate so as toposition the camera on a measurement point specified by the recipe mainbody, storing a resultant moving picture in a temporary storing memory,and recording the moving picture in association with whether erroroccurrence is present when the measurement process is finished. If thesemiconductor processing apparatus disclosed in JP-A-2003-17378 isapplied to the automatic observation process using the scanning electronmicroscope, therefore, only the moving picture of the sample imagespecified to be acquired to execute the individual automatic processsuch as the alignment, the pattern detection at the measurement point,the focusing and the length measurement has been preserved by theautomatic observation process algorithm regardless of whether an erroroccurs, even when an error has occurred. Therefore, moving picturesbefore the acquisition of the moving picture of the sample imagespecified to be acquired to execute the individual automatic process bythe algorithm for the automatic observation process is started or afterthe acquisition of the moving picture of the sample image specified tobe acquired to execute the individual automatic process is temporarilyfinished are not recorded. As a result, details resulting in the erroroccurrence cannot be confirmed. As regards a failure for which theinformation of details resulting in the error occurrence becomesnecessary, sufficient analysis cannot be conducted.

In the scanning electron microscope, therefore, it is also conceivableto pick up all images of the sample that can be acquired during theoperation of the apparatus and record them, unconditionally. However, itis not practical to continue to record the moving picture of the sampleimage inclusive of unnecessary portions during the execution of therecipe. There is a problem that not only the capacity of the recordingdevice for recording the moving picture of the sample image obtained asthe measurement result increases but also the labor and time periodrequired to confirm the details resulting in the error occurrence alsoincrease.

The present invention has been achieved in order to solve theabove-described problems. The present invention relates to a scanningelectron microscope applied to the automatic observation process. Anobject of the present invention is to provide a scanning electronmicroscope that makes it possible to save the labor of executing thereproduction test as a technique for analyzing an error, conduct basicanalysis on a problem caused in execution of the automatic observationprocess, and confirm details resulting in the error easily and rapidly.

In accordance with the present invention, in a scanning electronmicroscope including an electro-optical system for scanning andirradiating top of a sample with an electron beam, a detection systemfor detecting a signal generated from a sample by the scanning andirradiation with the electron beam conducted by the electro-opticalsystem, and automatic observation control means for controllingoperation of the electro-optical system and executing an automaticobservation process of the sample by using the detection system inaccordance with a previously registered recipe, the scanning electronmicroscope includes image generation means for generating a sample imageon the basis of a detected signal supplied from the detection system,image storage means for successively storing the sample image generatedby the image generation means, and recording the sample imagecorresponding to a predetermined video quantity while successivelyoverwriting the sample image, error image recording means for recordingthe sample image transferred from the image storage means, and recordingcontrol means responsive to an error in execution conducted by theautomatic observation control means, for going back in the sample imagesuccessively stored in the image storage means before occurrence of theexecution error included in the sample image successively stored in theimage storage means, from time of the occurrence of the execution errorby a predetermined video quantity, and recording the sample image in theerror image recording means.

In a scanning electron microscope according to the present invention,when going back from the occurrence time of the error, which hasoccurred during execution conducted by the automatic observation controlmeans, by a predetermined video quantity, and recording the sample imagein the error image recording means, the recording control means recordsthe sample image in association with recording of observation conditionsof the automatic observation process that is being executed at the timeof error occurrence of the execution conducted by the automaticobservation control means.

In a scanning electron microscope according to the present invention,when going back from the occurrence time of the error, which hasoccurred during execution conducted by the automatic observation controlmeans, by a predetermined video quantity, and recording the sample imagein the error image recording means, the recording control means recordsthe sample image in association with recording of error informationconcerning the execution error that has occurred.

A scanning electron microscope according to the present inventionincludes perusal control means for reading out the sample image recordedin the error image recording means and supplying a reproduced output ofthe sample image to display means, or especially perusal control meansfor reading out a sample image corresponding to specified errorinformation from among sample images recorded in the error imagerecording means, and supplying a reproduced output of the sample imageto display means.

According to the scanning electron microscope of the present invention,it becomes possible to confirm the cause of an error that has occurredduring execution of the automatic observation process according to therecipe, by using a video image recorded when the error has occurred andpreserved in the error image recording means, without reproducing theproblem by using the apparatus, sample, recipe and operator unlike theconventional technique. As a result, the labor required to reproduce theerror phenomenon can be reduced. In addition, basis analysis of theproblem that occurs in the execution of the automatic observationprocess can be conducted, and it is facilitated to confirm the errorprocess.

In addition, as for the video image recorded when the error has occurredas well, it is not restricted to the moving picture of the sample imagespecified to be acquired to execute the individual automatic process byan algorithm for the automatic observation process. The recordingcontrol means retrocedes in the sample image successively stored in theimage storage means before occurrence of the execution error included inthe sample image successively stored in the image storage means whilebeing overwritten, from time of the occurrence of the execution error bya predetermined video quantity, and records the sample image in theerror image recording means. As a result, the sample image obtainedbefore the acquisition of the moving picture for executing theindividual automatic process is started by the algorithm for theautomatic observation process according to the recipe and the sampleimage obtained after the acquisition of the moving picture for executingthe individual automatic process is temporarily finished are alsorecorded as a series of moving pictures for confirming the cause at thetime of error occurrence, and they can be reproduced. Accordingly, it isfurther facilitated to confirm the details resulting in the error.

As for the acquired series of moving pictures as well, unnecessaryportions having no relations to the confirmation of the error process atall can be removed previously before recording by suitably setting thevideo quantity of the retroactivity. As a result, it is also helpful inexpediting the confirmation work.

Other objects, features and advantages of the invention will becomeapparent from the following description of the embodiments of theinvention taken in conjunction with the accompanying drawings.

BRIEF DESCRIPTION OF THE DRAWINGS

FIG. 1 is a schematic configuration diagram of a scanning electronmicroscope according to an embodiment of the present invention;

FIG. 2 is a diagram showing a recording configuration of a recordingdevice which serves as image storage means in the scanning electronmicroscope according to the embodiment;

FIG. 3 is a flow chart of a sequence example of a CD measurement processusing the scanning electron microscope according to the embodiment;

FIG. 4 is a diagram showing a recording configuration for recording anerror image in the scanning electron microscope according to theembodiment into error image recording means;

FIG. 5 shows an example of an error monitor view displayed whenautomatic length measurement in the CD measurement process using thescanning electron microscope according to the present embodiment hasfailed;

FIG. 6 shows an example of a menu view for moving picture reproductionof an error image in the scanning electron microscope according to thepresent embodiment;

FIG. 7 is an error log display view of all errors that have occurred inthe automatic observation process conducted using the scanning electronmicroscope according to the embodiment; and

FIG. 8 is a diagram showing an example of an original display viewdisplayed as an output during execution of the automatic observationprocess on a display device serving as an input/output device in ascanning electron microscope according to another embodiment of thepresent invention.

DESCRIPTION OF THE EMBODIMENTS

Hereafter, a scanning electron microscope 100 according to an embodimentof the present invention will be described with reference to thedrawings.

FIG. 1 is a schematic configuration diagram of a scanning electronmicroscope according to an embodiment of the present invention.

A voltage from a high voltage control power supply 20 controlled by acomputer 40 is applied between a cathode 1 and a first anode 2. Aprimary electron beam 4 is extracted from the cathode 1 with apredetermined emission current.

An acceleration voltage is applied between the cathode 1 and a secondanode 3 by the high voltage control power supply 20 which is controlledby the CPU 40. Thus, the primary electron beam 4 emitted from thecathode 1 is accelerated to advance to a lens system in a subsequentstage.

The primary electron beam 4 is focused by a first focusing lens (beamfocusing means) 5, which is controlled by a first focusing lens controlpower supply 21. An unnecessary region of the primary electron beam 4 isremoved by a diaphragm plate 8. Thereafter, the primary electron beam 4is focused on a sample 10 held on a sample stage 15 as a minute spot bya second focusing lens 6 controlled by a second focusing lens controlpower supply 22 and an object lens 7 controlled by an object lenscontrol power supply 23.

In this case, the object lens can take various forms such as an in-lenssystem, an out-lens system and a snorkel system (semi-in-lens system).Furthermore, a retarding system which applies a negative voltage to thesample 10 and decelerates the primary electron beam 4 is also possible.In addition, each lens may be an electrostatic lens formed of aplurality of electrodes.

The top of the sample 10 is scanned two-dimensionally by the primaryelectron beam 4 according to a scanning coil 9 controlled by amagnification control power supply 24. A signal of the scanning coil 9is controlled by the magnification control power supply 24 according toan observation magnification (measurement magnification), and itsscanning range is controlled. A two-stage deflection coils (image shiftcoils) 32 are disposed in the same position as the scanning coil 9. Ifthe beam is inclined, then the position of the primary electron beam 4which is incident on the object lens 7 can be controlledtwo-dimensionally by a beam position control power supply 31 so as tocause an object point of the object lens 7 to become a deflectionfulcrum. In its turn, a scanning region (observation visual field) ofthe primary electron beam 4 on the sample 10 can be movedtwo-dimensionally.

The sample stage 15 can move the sample 10 in at least two directions (Xdirection and Y direction) in a plane perpendicular to the primaryelectron beam 4 according to a movement mechanism which is added to thesample stage 15 and which is not illustrated.

On the other hand, a secondary signal (sample signal) 12 includingsecondary electrons generated from the sample 10 by irradiation usingthe primary electron beam 4 is advanced to an upper part of the objectlens 7, separated from the primary electrons according to energydifference by an orthogonal electromagnetic field generation device 11for secondary signal separation, advanced in a direction of a secondarysignal detector 13, and detected by the secondary signal detector 13.The signal detected by the secondary signal detector 13 is amplified bya signal amplifier 14, subjected to A/D conversion in an A/D converterwhich is not illustrated, and taken in the computer 40 as occasiondemands.

As described above, the scanning electron microscope 100 according tothe present embodiment includes an electro-optical system for generatingthe primary electron beam 4 having the predetermined emission current byusing the cathode 1 and the first and second anodes 2 and 3, andscanning and irradiating the sample 10 placed on the movable samplestage 15 by the primary electron beam 4, and a detection system forseparating the sample signal by using the orthogonal electromagneticfield generation device 11 and detecting the sample signal by using thesecondary signal detector 13.

On the other hand, a detected signal taken in the computer 40 from thesecondary signal detector 13 is converted to image information of thesample image by image generation means in the computer 40, insynchronism with scanning on the sample 10 using the primary electronbeam 4 conducted by the scanning coil 9. The image information of thesample image subjected to the conversion process is successivelytransferred to a display image memory 25 and generated as an output.

The image information of the sample image generated and output to thedisplay image memory 25 is converted to a video signal by displaycontrol means formed in the computer 40. The video signal is supplied toan image display device 26. The sample image is displayed on the imagedisplay device 26 as a moving picture as occasion demands.

By using an input-output device 42, various kinds of setting for thescanning electron microscope 100 can be input. For example, selection ofa recipe, specifying and changing basic information required forexecution of the automatic observation process in the recipe such as analignment point position, a measurement point position and a measurementmagnification in the selected recipe, specifying and changing a templatewhich serves as a guide in detecting an accurate position and dimensionof a measurement point required to execute the automatic observationprocess, and specifying reproduction of a recorded and stored image atthe time when an error has occurred as described later are input.Furthermore, the input-output device 42 has a configuration capable ofconducting output display of various kinds of information (such as asample image of a measurement subject, measurement conditions, ameasurement result, and error information) acquired as the automaticobservation process is executed. When an error is caused by execution ofthe automatic observation process, therefore, information of the erroris displayed. The input-output device 42 includes, for example, anoperation input device such as a keyboard and a mouse connected to thecomputer 40 and a display device.

Recipes for causing the scanning electron microscope 100 to conduct theautomatic observation process are registered in a recording device 41.In addition, various kinds of information (such as the above-describedsample image of the measurement subject, measurement conditions, themeasurement result, and error information) previously specified to beacquired is stored in accordance with an algorithm of an automaticobservation process according to a selected recipe.

In the present embodiment, the computer 40 functions as automaticobservation control means for taking in a recipe stored in the recordingdevice 41, and controlling operation of the electro-optical system andexecuting an automatic observation process of the sample by using thedetection system in accordance with the recipe, besides theabove-described image generation means and the display control means.Furthermore, since the computer 40 acquires image information of thesample image specified to be acquired in order to execute an individualautomatic process in accordance with an algorithm of the automaticobservation process, exercises control to store the acquired imageinformation of the sample image in the recording device 41 as one of theabove-described various kinds of information, and exercises control tostore an error moving picture described later in a recording device 44,the computer 40 functions as recording control means as well. And therecording device 41 functions as automatic observation result recordingmeans for recording various kinds of information, such as the imageinformation of the sample image, measurement conditions, the measurementresult, and information of an error caused during execution, specifiedto be acquired to execute an individual automatic process by analgorithm when the automatic observation process is executed.

A configuration for recording the sample image (error moving picture)when an error has occurred during the execution of the automaticobservation process according to a recipe in the scanning electronmicroscope 100 according to the present embodiment will now bedescribed.

The scanning electron microscope 100 according to the present embodimentincludes a recording device 43 serving as image storage means forsuccessively storing sample images generated and output to the displayimage memory 25 by the image generation means in the computer 40 andrecording sample images corresponding to a predetermined video quantity(for example, t1 in total recording time period) while successivelyconducting overwriting, and the recording device 44 serving as errorimage recording means for storing the sample image (error movingpicture) at the time of error occurrence.

FIG. 2 is a diagram showing a recording configuration of the recordingdevice serving as the image storage means in the scanning electronmicroscope according to the present embodiment.

In the present embodiment, the recording device 43 includes a storagemedium such as a semiconductor memory or a hard disk drive, and has arecording capacity capable of recording the moving picture of the sampleimage as a moving picture by the total time period t1.

The image information of the sample image generated and output to thedisplay image memory 25 to be supplied to the image display device 26which displays the sample image as a moving picture as occasion demandsis successively stored in the recording device 43 by the computer 40which functions as the recording control means as well as describedabove. The image information is recorded in the recording device 43 by apredetermined video quantity (for example, by t1 in total recording timeperiod) while being successively overwritten. Specifically, in order tocontinue to record latest image information of the sample image in therecording device 43 capable of storing a finite video quantity, imageinformation of the sample image recorded at new time is written overimage information of the sample image recorded at the oldest time (imageinformation of the sample image recorded t1 before) when a recordingcapacity that can be recorded by the recording device 43 (the videoquantity corresponding to t1 in total recording time period) is reached.This operation is repeated as shown in FIG. 2. As a result, recordingrestrictions of the image information of the sample image caused by therecording capacity of the recording device 43 are removed.

The recording capacity required of the recording device 43 changesdepending upon a difference of basic information in a recipe of theautomatic observation process executed by the computer 40 serving as theautomatic observation control means in accordance with the recipe. Inthe present embodiment, it is also possible to set the maximum totalrecording time period shorter than the predetermined video quantity (forexample, t1 in total recording time period) of the recording device 43according to the need for confirming the error process by using theinput-output device 42.

If a recording capacity of the recording device 43 corresponding to t1in total recording time period cannot be ensured because of the imageinformation quantity of one frame of the sample image concerning thesize and complexity of the observed surface of the sample, then settingcan be changed so as to be able to ensure the total recording timeperiod t1 without changing the recording capacity of the recordingdevice 43 by changing a sampling rate st of the image information of thesample image generated and output to the display image memory 25 whichsuccessively stores image information while the image information isbeing overwritten in the recording device 43 by the computer 40 andthereby adjusting the number of acquired frames of the image per unittime period (second).

For example, acquisition of image information of the sample image whichhas been acquired to execute an individual automatic process until thenis stopped on the basis of a certain acquisition stop instructioncontained in an algorithm of an automatic observation process accordingto a recipe. And recording of the image information of the sample imageinto the recording device 41 is stopped at time ts1. Acquisition of theimage information of the sample image is newly started on the basis ofan acquisition instruction to execute another individual automaticprocess. And recording of the image information of the sample image intothe recording device 41 is resumed. Thereafter, the acquisition of theimage information of the sample image is stopped again on the basis of asubsequent acquisition stop instruction. And recording of the imageinformation of the sample image into the recording device 41 is stoppedat time ts2. If the recording capacity (t1 in total recording timeperiod) of the recording device 43 is just enough to store the imageinformation of the sample image generated and output to the displayimage memory 25 over a period between ts1 and ts2 (for example, over aperiod between individual automatic processes in the series of sequences(1) to (5) described in BACKGROUND OF THE INVENTION), then it becomespossible to cope with occurrence of an error by retroceding to time whenit was confirmed that no errors occurred, and recording the imageinformation of a series of sample images as a moving picture, whilesuppressing the increase of the recording capacity of the display imagememory device 43. Therefore, details resulting in the error occurrence(error process) can be confirmed more easily.

On the other hand, the recording device 44 includes a recording medium,for example, such as a hard disk drive. The recording device 44 has arecording capacity capable of recording the sample image (movingpicture) over a total time period t3 (where t3>>t1) when an error hasoccurred. As a result, the sample image (moving picture) when an errorfor which confirmation of the error process is already finished hasoccurred can also be used to confirm an error process concerning anerror that has newly occurred.

It is now supposed that the computer 40 in the scanning electronmicroscope 100 according to the present embodiment calls a recipe storedin the recording device and an error has occurred while the computer 40is executing the automatic observation process in accordance with therecipe. It is also supposed that the scanning electron microscope 100 isexecuting the CD measurement process as the automatic observationprocess.

FIG. 3 is a flow chart showing an embodiment of a sequence of the CDmeasurement process using the scanning electron microscope according tothe present embodiment.

The computer 40 in the scanning electron microscope 100 starts executionof a CD measurement process according to a measurement recipe specifiedby a user's order given from the input-output device or by a hostcomputer which is not illustrated. Thereupon, a carry-in and carry-outmechanism which is not illustrated is operated on the sample stage 15 ina sample chamber, and a wafer (sample) 10 having a chip formed thereonis carried in (wafer load) (step S10). And the scanning electronmicroscope 100 moves the sample stage 15 having the wafer 10 placedthereon to an alignment point (wafer alignment point) (step S20).Alignment (wafer alignment) is executed (step S30). The movement to thealignment point (step S20) and the alignment (step S30) are executedrepetitively as many times as the number of alignment points registeredin the measurement recipe.

Subsequently, the scanning electron microscope 100 controls the movementof the sample stage 15 having the wafer 10 placed thereon (step S40),conducts coarse detection of a length measurement point of the wafer 10registered in the measurement recipe at low magnification, and positionsthe coarsely detected length measurement point in a center within ascanning range (observation range) of the primary electron beam 4 (stepS50). And the scanning electron microscope 100 sets the lengthmeasurement magnification (high magnification) registered in themeasurement recipe (step S60), and executes focusing and astigmatism ofthe object lens 7 so as to obtain a scanning image at the lengthmeasurement point with an optimum beam diameter of the primary electronbeam 4 (step S70). Thereafter, the scanning electron microscope 100executes the length measurement by using a template registered in themeasurement recipe on the basis of a sample image at the lengthmeasurement point acquired at that time (step S80).

Upon finishing a series of individual automatic processes ranging fromthe movement control of the sample stage 15 (step S40) to the lengthmeasurement at the length measurement point (step S80) as many times asthe number of length measurements registered in the measurement recipe,the scanning electron microscope 100 carries out the wafer (i.e., onewafer) 10 from the sample stage 15 in the sample chamber (waferunloading), and terminates the CD measurement process according to themeasurement recipe concerning the wafer 10 (step S90).

It is now supposed that an error is caused in the execution of the CDmeasurement process by a situation of (a) the sequence, (b) the image,(c) operation of the recipe, or (d) the image or hardware. A recordingprocess of the sample image (error moving picture) conducted by thescanning electron microscope 100 in this case will now be described.Supposing that an error is caused in the “focusing and astigmatismadjustment” process at step S70 by any of (a) to (d), the recordingprocess will now be described.

In the scanning electron microscope 100 according to the presentembodiment, the computer 40 serving as the image generation meansconverts a detected signal supplied from the secondary signal detector13, successively transfers the detected signal to the display imagememory 25, and generates and outputs the sample image, during theoperation of the started image generation means, regardless of whetherthe wafer (sample) 10 is placed on the sample stage 15. The computer 40serving as the recording control means records the sample imagecorresponding to the predetermined video quantity (for example, t1 intotal recording time period) while successively transferring andoverwriting the sample image. Therefore, the recording device 43 hasalways the latest generated sample image corresponding to thepredetermined video quantity stored therein.

In FIG. 3, an example of a section in which the newly generated sampleimage is successively recorded in the recording device 43 and only thesample image corresponding to the predetermined video quantity (forexample, t1 in total recording time period) is recorded while beingoverwritten is denoted by an arrow K. As for the section K, a desiredprocess portion such as K1 to K3 can be specified from the input-outputdevice 42 in the scanning electron microscope 100 according to thepresent embodiment. For example, in the CD measurement process accordingto the measurement recipe of the scanning electron microscope 100, it isnot necessary in some cases to preserve especially an error image as amoving picture in duplication as regards an error already known to occurbefore execution of the process. By adopting a configuration capable ofspecifying a process portion, such as the section K1, K2 or K3 shown inFIG. 3, over which the sample image corresponding to the predeterminedvideo quantity is recorded in the recording device 43, from theinput-output device 42, therefore, the recording of the sample imagethat is not needed to analyze the cause of a failure on the basis of theerror image into the recording device 43 can be omitted. By adopting aconfiguration in which narrowing down to a process portion that needs tobe analyzed is conducted and only the error image thereof is recorded inthe recording device 43, it becomes possible to analyze the failurecause more easily and rapidly. In FIG. 3, the section K1 represents thecase where it is specified from the input-output device 42 to alwaysrecord the latest sample image corresponding to the predetermined videoquantity while the computer 40 serving as the image generation means isin operation regardless of whether the wafer (sample) 10 is on thesample stage 15. The section K2 represents the case where a desiredindividual automatic process (in the illustrated case, a plurality ofindividual automatic processes in the range of steps S50 to S70) in theseries of sequences is specified. The section K3 represents the casewhere a process after movement of the sample stage 15 is specified.Besides, although omitted in FIG. 3, a section K over which the sampleimage corresponding to the predetermined video quantity is recorded inthe recording device 43 can be specified by specifying a desiredmeasurement recipe and specifying a desired time and a time period onlyin the state in which a CD measurement process according to thespecified measurement recipe is being executed. In the ensuingdescription, it is supposed that the section K1 is specified from theinput-output device 42 as the section K over which the sample imagecorresponding to the predetermined video quantity is recorded in therecording device 43.

If an error is caused by any of (a) to (d) at time te in FIG. 3, i.e.,while the computer 40 is executing the “focusing and astigmatismadjustment” process at the step S70 in accordance with the measurementrecipe, then the computer 40 serving as the recording control means inthe scanning electron microscope 100 records information of a series ofsample images stored in the recording device 43 corresponding to t2(where t1≧t2) in the recording device 44 serving as the error imagerecording means as an error image as shown in FIG. 4.

FIG. 4 is a diagram showing a recording configuration for recording anerror moving picture into the error image recording means in thescanning electron microscope according to the present embodiment.

If the computer 40 detects occurrence of an error that might have beencaused by any of (a) to (d) on the basis of, for example, an abnormalityin the execution state of the “focusing and astigmatism adjustment”process in the CD measurement process according to a recipe, then thecomputer 40 extracts a sample image lm(t2) obtained by retroceding froma sample image lm(te) stored so as to be associated with the time te ofthe error occurrence by a predetermined video quantity (for example,total recording time period t2) previously set and registered by theinput-output device 42, from the sample image stored in the recordingdevice 43. In addition, the computer 40 adds a sample image recordedafter the time te to the sample image lm(t2) as occasion demands, andstores a resultant sample image in the recording device 44.

As a result, a sample image lm(t) started at time (te-t2) which precedesthe error occurrence time te by a previously set and registeredpredetermined video quantity (for example, the total recording timeperiod t2) is recorded in the recording device 44 as an error movingpicture.

The video quantity previously set and registered by the input-outputdevice 42 (for example, the total recording time period t2), i.e.,retroactivity for the error occurrence time can be arbitrarily set fromthe input-output device 42 under the condition that t1≧t2 on the basisof the recording capacity (the total recording time period t1) of therecording device 43.

In an automatic observation process according to a recipe, recording ofimage information into the recording device 41 is stopped at time ts1 onthe basis of one acquisition stop instruction contained in thealgorithm. And recording of the image information of the sample imageinto the recording device 41 started on the basis of the nextacquisition instruction is stopped at time ts2 on the basis of the nextacquisition stop instruction. If the retroactivity (t2 in totalrecording time period) toward the error occurrence time is just enoughto store the image information of the sample image generated and outputto the display image memory 25 over a period between ts1 and ts2 (forexample, over a section between individual automatic processes in theseries of sequences (1) to (5) described in BACKGROUND OF THEINVENTION), then advantageously it becomes possible to cope withoccurrence of an error by retroceding to time when it was confirmed thatno errors occurred, and recording the image information as a movingpicture of a series of sample images. Typically, however, theretroactivity (t2 in total recording time period) is set at least nearlyto a time period required for measurement (observation) of one lengthmeasurement point (observation point).

In FIG. 3, R1, R2, R3 and R4 indicate examples of end time of recordingof the error moving picture into the recording device 44 in the casewhere an error has occurred at time te. In the error image recordingexample R1, the sample image is recorded into the recording device 44 asthe error moving picture between time (te-t2) and the time te. In theerror image recording example R2, the sample image is recorded into therecording device 44 as the error moving picture between the time (te-t2)and time when an individual automatic process (the “focusing andastigmatism adjustment” process in the case of FIG. 3) in which an errorhas occurred is finished. In the error image recording example R3, thesample image is recorded into the recording device 44 as the errormoving picture between the time (te-t2) and time when measurement(observation) of a measurement point (observation point) in which anerror has occurred is finished. In the error image recording example R4,the sample image is recorded into the recording device 44 as the errormoving picture between the time (te-t2) and time when the CD measurementprocess (observation process) of a sample in which an error has occurredis finished. In this way, the recording end timing of the error movingpicture can be arbitrarily set. In the present embodiment, the recordingend timing of the error moving picture can be arbitrarily set from theinput-output device 42 in the same way as the retroactivity (t2 in totalrecording time period).

When recording a series of error moving pictures obtained when an errorhas occurred into the recording device 44 in the scanning electronmicroscope 100 according to the present embodiment, the computer 40links the series of error moving pictures and various kinds ofinformation (such as the sample image of the measurement subject,measurement condition, measurement result and error information)acquired by execution of the CD measurement process, to each other andstores them in the recording devices 41 and 42.

A configuration for confirming a cause of an error which has occurred inthe CD measurement process conducted by the scanning electron microscope100 according to the present embodiment will now be described.

FIG. 5 shows an embodiment of an error monitor view displayed by thescanning electron microscope according to the present embodiment whenautomatic length measurement in the CD measurement process has failed.

If the automatic length measurement has failed in the CD measurementprocess conducted by the scanning electron microscope 100, theninformation of an error that has occurred during execution of the CDmeasurement recorded into the recording device 41 by the computer 40, ifany, is window-displayed on an error monitor view 60 on a screen of adisplay device, which forms the input-output device 42 in conjunctionwith the operation input device such as the keyboard and the mouse,automatically after the end of the CD measurement process or in responseto a predetermined manual operation of the input-output device 42.

In the case of the example shown in FIG. 5, a generated error displaypart 62 which can be scrolled in display, and operation buttons 64 suchas Video, Detail, Clear and Close buttons are displayed. As regards allerror information generated during execution of the last CD measurementprocess, the last generated error list having an error code or an errorsummary as an index is displayed in the generated error display part 62on the basis of error information stored in the recording device 41.

In the state in which a desired error list item selected from the lastgenerated error list is active-displayed, the user operates the Videobutton or double-clicks the mouse. As a result, a video start image of asample image (error image) associated with the linked error list item isdisplayed, and a menu 66 for moving picture reproduction such as “videoplay,” “rewind” and “fast feed” shown in FIG. 6 is displayed. And itbecomes possible to video-display the error image.

FIG. 6 shows an embodiment of a moving picture reproduction menu view ofan error image in the scanning electron microscope.

The case where a desired error image selected from among all errorsgenerated in the automatic observation process conducted by the scanningelectron microscope 100 until then is displayed as a moving picture willnow be described.

FIG. 7 shows an error log display view of all errors that have occurredin the automatic observation process conducted using the scanningelectron microscope according to the present embodiment.

An error log display view 70 showing all errors is utilized when, forexample, the user determines, as to a cause of an error that has newlyoccurred, whether a similar error that is likely to be helpful iscontained in all errors that have occurred in the automatic observationprocess until then. When the user has conducted a predeterminedoperation on the operation input device in the input-output device 42,the error log display view 70 is window-displayed on the screen of thedisplay device in the input-output device 42 by the computer 40. Theerror log display view 70 includes an error history display portion 72which is scroll-displayed, a retrieval condition input portion 74 forsetting and inputting a retrieval condition, and buttons 76 such asVideo, Print and Help buttons. In the error history display portion 72,a list of indexes of all errors that have occurred in the automaticobservation process until then is displayed on the basis of all errorinformation stored in the recording device 41. For example, as indexdisplay items of each error history, an error code, an error occurrenceplace, and an error occurrence date and time are displayed. Whiledirectly referring to the error history displayed in the error logdisplay view 70, the user inputs one or more desired index display itemsto the retrieval condition input portion 74 as a retrieval item, selectsa desired error history, and brings the selected error history into anactive display state. In that state, the user operates the Video buttonor double-clicks the mouse. As a result, a video start image of a sampleimage associated with the linked error is displayed, and the menu 66 formoving picture reproduction such as “video play,” “rewind” and “fastfeed” shown in FIG. 6 is displayed. And it becomes possible tovideo-display the sample image of the error.

For confirming the cause of the error that has occurred in the CDmeasurement process conducted as the automatic observation process ofthis time in the scanning electron microscope 100 according to thepresent embodiment, the user first specifies an error to be confirmedfrom among errors that have occurred this time by using the errormonitor view 60, and operates its Video button.

As a result, information of the sample image at the time when the errorhas occurred is called from the recording device 44 into the computer40. The information is displayed on the screen of the display device inthe input-output device 42 as a moving picture by a moving picturereproduction function provided in the computer 40.

And the user grasps a problem place by reproducing the moving picture ofthe sample image obtained when this error has occurred. Thereafter, theerror log display view 70 is displayed. By directly referring to theerror history displayed in the error history display portion 72, orinputting one or more desired index display items to the retrievalcondition input portion 74 as retrieval items, the user selects adesired error history and operates the Video button.

As a result, information of the sample image at the time when the errorin the error history has occurred is called from the recording device 44into the computer 40. The information is displayed on the screen of thedisplay device in the input-output device 42 as a moving picture by themoving picture reproduction function provided in the computer 40.

While comparing the moving picture of the error to be confirmed with themoving picture of the error in the error history, the user can confirmthe cause of the error that has newly occurred and execute its analysisprocess.

The scanning electron microscope 100 according to the present embodimenthas the configuration heretofore described. However, the embodiment ofthe scanning electron microscope according to the present invention isnot limited to the configuration heretofore described.

For example, the recording of the error image at the time of erroroccurrence in the automatic observation process is started from thesample image acquired t2 (where t1≧t2) before the time of the erroroccurrence, on the basis of the recording capacity (for example, t1 intotal recording time period) of the recording device 43. However, thisis not restrictive. For example, the sample image started in acquisitionwhen the error has occurred can be put forward and put back in time, bysuitably increasing the recording capacity of the recording device 43,or by changing a sampling rate st of the image information of the sampleimage generated and output to the display image memory 25 as describedabove without changing the recording capacity of the recording device43. As a matter of course, the sample image started in acquisition whenthe error has occurred can also be put forward and put back in time, byincreasing or decreasing the recording capacity itself of the recordingdevice 43.

In addition, instead of determining the sample image itself started inacquisition by unique retroactivity based on time predetermined on thebasis of the error occurrence time, the user may specify acquisitionstart directly from the input-output device 42. According to this,irrespective of difference in measurement point between measurementrecipes, for example, a time period between the movement to the firstlength measurement point at the step S40 shown in FIG. 3 and thecompletion of the length measurement at the last length measurementpoint conducted at the step S80 may also be specified. For example, inboth the case of a wafer 10 in which an error is caused in the lengthmeasurement at the first length measurement point and the case ofanother wafer 10 in which an error is caused in the length measurementat the last length measurement point, therefore, error images having thesame section length can be generated regardless of difference in erroroccurrence time. In this way, it becomes possible to preserve the pasterror image by intentionally specifying a range. Therefore, it becomespossible to create, for example, a manual of a measurement procedure byusing a video image. As regards the behavior of the video imagecontaining a time variation such as image shaking, it also becomespossible to register it in the recording device 44 as a color imagefile.

In the scanning electron microscope 100 according to the presentembodiment, the recording device 41 and the recording device 44 areformed as separate recording devices. Alternatively, the recordingdevice 41 and the recording device 44 may be formed in the samerecording device. Furthermore, in the scanning electron microscope 100according to the present embodiment, the recording device 43 serving asthe image storage means and the recording device 44 serving as the errorimage storage means are formed as separate recording devices.Alternatively, the recording device 43 serving as the image storagemeans may be formed in a predetermined recording region ensured in therecording device 44 serving as the error image storage means.

In the scanning electron microscope 100 according to the presentembodiment, information of the sample image generated by the imagegeneration means in the computer 40 and transferred to the display imagememory 25 in order to be supplied to the image display device 26 isrecorded in the recording device 43 serving as the image storage means.Alternatively, a predetermined window portion that can be previouslyselected from display information of an original display view, whichincludes a display portion based on the information of the sample imagetransferred to the display image memory 25 and which is displayed on thedisplay device in the input-output device 42 during execution of theautomatic observation process, may be cut out, and stored instead of theinformation of the sample image stored in the display image memory 25,when an error has occurred.

FIG. 8 is a diagram of an embodiment of the original display viewdisplayed on the display device in the input-output device during theexecution of the automatic observation process.

As for an original display view 80, the whole original display view 80,a length measurement view main body portion 82, which is similar to theview displayed on the image display device 26 and which is included inthe original display view 80, and a length measurement view portion 84,which is obtained by adding display information such as measurementconditions and predetermined operation buttons to the length measurementview main body portion 82, can be recorded in the recording device 43and the recording device 44 in accordance with user's selection.

It should be further understood by those skilled in the art thatalthough the foregoing description has been made on embodiments of theinvention, the invention is not limited thereto and various changes andmodifications may be made without departing from the spirit of theinvention and the scope of the appended claims.

The invention claimed is:
 1. A recipe processing apparatus for ascanning electron microscope including automatic measurement processingmeans for controlling operation of the scanning electron microscope inaccordance with a predetermined recipe, the apparatus comprising: afirst storage medium for sequentially storing image information as firstmoving picture information obtained by the scanning electron microscopeup to a predetermined information quantity while overwritingsequentially, and a second storage medium for storing second movingpicture information corresponding to a predetermined informationquantity before occurrence of an error among the first moving pictureinformation stored in the first storage medium in accordance with theerror occurred on account of control of the automatic measurementprocessing means.
 2. The recipe processing apparatus according to claim1, wherein optionally selected information among information obtainedfrom the scanning electron microscope is selectively stored either inthe first or the second storage medium.
 3. The recipe processingapparatus according to claim 1, wherein information after occurrence ofthe error is also stored inclusively in either the first and the secondstorage medium.
 4. The recipe processing apparatus according to claim 1,wherein information stored in either the first or the second storagemedium is at least one of specimen image, measurement condition,measurement result, and error information obtained by the scanningelectron microscope.
 5. A data processing apparatus including a displayapparatus for displaying information from an automatic measurementprocessing means for controlling operation of a scanning electronmicroscope in accordance with a predetermined recipe, the apparatuscomprising: a first storage medium for sequentially storing imageinformation as first moving picture information obtained by the scanningelectron microscope to store a predetermined information quantity whileoverwriting sequentially, and a second storage medium for storing secondmoving picture information corresponding to a predetermined informationquantity in the first storage medium in accordance with the erroroccurred on account of control of the automatic measurement processingmeans.
 6. The recipe processing apparatus according to claim 5, whereinoptionally selected information among information obtained from thescanning electron microscope is stored either in the first or the secondstorage medium.
 7. The recipe processing apparatus according to claim 5,wherein information after occurrence of the error is also storedinclusively in either the first and the second storage medium.
 8. Therecipe processing apparatus according to claim 5, wherein informationstored in either the first or the second storage medium is at least oneof specimen image, measurement condition, measurement result or errorinformation obtained by the scanning electron microscope.
 9. A dataprocessing apparatus including a display apparatus for displayinginformation from an automatic measurement processing means forcontrolling operation of a scanning electron microscope in accordancewith a predetermined recipe, the apparatus comprising: a first storagemedium for sequentially storing display image displayed on the displayapparatus to store a predetermined quantity of first moving pictureinformation while overwriting; and a second storage medium for storingsecond moving picture information corresponding to a predeterminedinformation quantity before occurrence of an error among the firstmoving picture information stored in the first storage medium inaccordance with the error occurred on account of control of theautomatic measurement processing means.
 10. The recipe processingapparatus according to claim 9, wherein a selected area among thedisplayed image is stored in either the first or the second storagemedium.
 11. The recipe processing apparatus according to claim 9,wherein information after occurrence of the error is also storedinclusively in either the first and the second storage medium.
 12. Therecipe processing apparatus according to claim 9, wherein informationstored in either the first or the second storage medium is at least oneof specimen image, measurement condition, measurement result, and errorinformation obtained by the scanning electron microscope.